Lengths at Multiples of a Half-Wavelength

Eeff and Z0 cannot be calculated when the length of the calibration standard is an integral multiple of a half wavelength. At some point as the length of the calibration standard approaches a multiple of a half-wavelength, em is able to determine that the calculated values of Eeff and Z0 are becoming corrupt. When this occurs, em replaces the Eeff and Z0 data with a message indicating the error. Note, however, that while em is unable to determine Eeff and Z0, the de-embedded S-parameter results are still perfectly valid.